MIL-PRF-28750F
3.9 Solderability (applicable to solder terminals). When SSR's are tested as specified in 4.7.3, the dipped surface
of solid wire-lead and pin terminals shall be at least 95 percent covered with a continuous new solder coating. The
remaining 5 percent may contain only small pinholes or rough spots; these shall not be concentrated in one area.
Bare base metal where the solder dip failed to cover the original coating is an indication of poor solderability, and shall
be cause for failure. For solder-lug terminals, 95 percent of the total length of fillet, which is between the standard
wrap wire and the terminal, shall be tangent to the surface of the terminal being tested, and shall be free of pinholes
and voids. A ragged or interrupted line at the point of tangency between the fillet and the terminal under test shall be
a failure.
3.10 Seal. When tested as specified in 4.7.4, the standard leak rate (L value of Eq (1) of MIL-STD-883 Method
1014) shall be 1 x 10-6atm cm3/s of air.
3.11 Insulation resistance. When SSR's are tested as specified in 4.7.5, the resistance shall be 100 megohms
minimum. When specified (see 3.1), the insulation resistance between load circuits and input shall be 50 megohms
minimum.
3.12 Dielectric withstanding voltage (DWV). When tested as specified in 4.7.6, SSR's shall withstand the voltage
specified without damage, and there shall be no leakage current in excess of 1.2 milliampere (mA); and there shall be
no evidence of damage due to arcing (air discharge), flashover (surface discharge), or insulation breakdown
(puncture discharge).
3.13 Electrical characteristics. Unless otherwise specified, 100 percent of the electrical characteristics shall be
tested at -55C, +25C, and +125C. Manufacturer has the option for sequence of test temperature (+25C, -55C,
+125C), and the sequence in which the electrical characteristics tests are performed.
3.13.1 Reverse polarity (dc operated SSR's) (when specified, see 3.1). When tested as specified in 4.7.7.1, the
SSR shall not operate or be damaged. Following the test, the turn-on voltage, input current, and turn-off voltage shall
be as specified (see 3.1).
3.13.2 Input current (when specified, see 3.1). When SSR's are tested as specified in 4.7.7.2.1, the input current
shall be as specified (see 3.1).
3.13.3 Input turn-on voltage (when specified, see 3.1). When SSR's are tested as specified in 4.7.7.2.2, the SSR
shall operate as specified (see 3.1).
3.13.4 Input turn-off voltage (when specified, see 3.1). When SSR's are tested as specified in 4.7.7.2.3, the SSR
shall operate as specified (see 3.1).
3.13.5 Bias current (when specified, see 3.1). When SSR's are tested as specified in 4.7.7.2.4, the bias current
shall not exceed the specified value (see 3.1).
3.13.6 Control current (when specified, see 3.1). When SSR's are tested as specified in 4.7.7.2.5, the control
current shall not exceed the specified value (see 3.1).
3.13.7 Control turn-on voltage (when specified, see 3.1). When SSR's are tested as specified in 4.7.7.2.6, the
SSR shall operate as specified (see 3.1).
3.13.8 Control turn-off voltage (when specified, see 3.1). When SSR's are tested as specified in 4.7.7.2.7, the
SSR shall operate as specified (see 3.1).
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