MIL-PRF-28750F
6.11 Subject term (key word) listing.
Bias input configuration
Control input configuration
Hybrid
Marking
Relay, solid state
Screening
Short circuit protection
6.12 Exponential rate of voltage rise (reference 3.13.27 and 4.7.7.21): The test described is generally intended for
thyristor based output devices. Devices with FET and Bi-polar type outputs are not susceptible to false triggering and
this test may not be applicable. If such FET/Bi-polar devices are used, for example, in armament firing or similar
applications an alternative test of output capacitance and or let through current may be advisable.
6.13 Changes from previous issue. The margins of this specification are marked with vertical lines to indicate
where changes from the previous issue were made. This was done as a convenience only and the Government
assumes no liability whatsoever for any inaccuracies in these notations. Bidders and contractors are cautioned to
evaluate the requirements of this document based on the entire content irrespective of the marginal notations and
relationship to the previous issue.
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